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Stimulus Induced Fault Testing (SIFT)

        -- Go beyond OBIRCH & TIVA type methods with high aspect contiguous scans


The image above shows a Crystal Vision probe station-based microscope system in a dark-box, optimized for SIFT


SIFT allows for the analysis of numerous stimuli to identify speed, fault, and parametric differences in silicon.  The heart of the SIFT technique revolves around intentionally disturbing devices with external stimuli and comparing the test criteria to reference parts or timing/voltage sensitivities.  Synchronous interfacing is possible to any tester without any wiring or program changes. The system can be based on either a motorized probe station or portable microscope stand for test head applications.

The SIFT scanner does not use traditional laser scanning microscope optics and is actually quite straightforward in construction.  DUT scan area can be from microns to 300mm or more, allowing whole boards, packages and die to be analyzed since the scanners are stepper-based rather than internal optics based.




Spot = 500 microns
Scan = 9x14

   Spot = 100 microns
   Spot = 50 microns
126 test loops for 9x14 area  Test time = 500 msec/loop

White Paper on SIFT Methods and Benefits
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