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NOVEMBER 2016

Publication of “In Situ’ Mechanical Sample Preparation of Selected Sites and

Components on Large Modules and Boards” @ ISTFA 2016

October 2016

Patent Issued for Thermal relaxation and stabilization techniques during sample preparation

August 2016

Patent issued for Thermal Gradient Methods

August 2014

Patent issued for Thermal Gradient Apparatus

March 2013

Additional Patent issued for SIFT


NOVEMBER 2012

END-POINT PAPER WINS 'BEST IN CONFERENCE' AWARD @ ISTFA 2012

Please download our ISTFA Papers from the  LIBRARY

 

 

MAY 2011

Find Defect Sites through 3D Triangulation

Contact us to find out the latest about Time of Flight SIFT

or download the ISTFA Paper

 

AUGUST 2010

Come see us @ ISTFA 2010!

Dallas, TX - Intercontinental Hotel - November 16-17  -- We are located at Booth # 707

Click here for Registration Information

 

JUNE 2010

Image copyright DL Burgess

In May 2010, President of FA Instruments, Jim Colvin updated the EDFAS Golden Gate Chapter on the challenges and solutions of Photo Voltaic failure analysis. For a copy of the presentation, or for further information, please contact jim@fainstruments.com

 

FEBRUARY 2010

New Location -- Expanded Service & Application Lab Facilities!

We have moved! Please note our move is just a few doors down. Our new phone system incorporates email to serve you better and we have added a dedicated sample prep room. Please update your records.

Our New Address is:

2381 Zanker Rd. Suite 100

San Jose, CA 95131

(408) 789 7560 (forwards voice message to email if no answer)

cell: (510) 851 5555

fax: (484) 210 2961

 

DECEMBER 2009

New Papers posted in the FAI Library

"Gradient Thermal Analysis by Induced Stimulus" - ISTFA 2009  

"Comparative Failure Analysis of Photovoltaic Devices" -- ISTFA 2009  

 

SEPTEMBER 2008

Tri-port Crystal Vision Systems now shipping!

Shown above is a tri-port Crystal Vision system optimized for SIFT and photon emission

 

MAY 2008

Introducing... 

FA Instruments introduces a major new expansion to our applications portfolio. The use of our patented SIFT and NIR-based analytical technologies offers the means for unsurpassed information-gathering through high sensitivity scans of all sizes of solar cell.

For more information, please follow this link.

 

APRIL 2008

SEMICON CHINA

 

We were  proud to be located on the Booth of our China Sales Partners, BE-FIRST TECHNOLOGY . Thanks for stopping by the Booth!

 

December 2007

THANKS FOR MAKING ISTFA & 2007 A GREAT SUCCESS!

FA Instruments would like to thank all the visitors to our booth at ISTFA this year!

As you have seen, 2007 has been a year of significant milestones in FAI's technology portfolio and our growth as a leader in the field.  Our new integrated offerings in SIFT and in VISGaAs and InSb sensor technologies allow us to further push the boundaries of FA.

We thank you for opening the door to better analytical techniques!

 

November 2007

NEW COMPANY BROCHURE

Download a copy of our new brochure by clicking here  -- or request a hard copy by e-mailing us

 

October 2007

New Company Ads

 

September 2007

See us @ ISTFA 2007 - San Jose Convention Center - November 4-8

We are also proud to be a Platinum Level Show Sponsor of the ISTFA Conference

-- Booth # 503

 

March 2007

InSb Sensor Images (640 x 480) are Here!

FA Instruments is pleased to announce another "FIRST": the availability of InSb sensor technology to achieve Mid-range thermal imaging. Contact us to find out more about the FA products and services we offer which allow you to achieve the best analytical results with this exciting technology.

 

 

February 2007

FAI Company CEO to give FA Tutorial at IEEE IRPS 2007

www.irps.org

RELIABILITY PHYSICS TUTORIALS ,  Monday April 15-16 - Room D, 1.00 to 2.30pm , Phoenix Convention Center , Phoenix, AZ

Abstract

This tutorial will demonstrate how to get reliable failure analysis information by way of an overview of the FA tools and methods with insightful examples. You will leave with an enhanced understanding of FA capabilities, myths and limitations so as to better drive towards a true root cause determination. This is a must see tutorial not just for failure analysts but those individuals who request or receive failure analysis data.

Click here for the Slide Presentation

July 2006

FA Instruments exhibiting at SEMICON WEST!

We will be at booth #Booth 5234 North Hall.

 

May 2006

InGaAs Systems now Shipping!

Click here to find out more.

 

 

April 2006

Advancing IC Diagnostics Newsletter - New Issue

Click Image to Download. This Issues features our new InGaAs Camera, and the Software Parametric Analyser built into Crystal Vision.

 

March 2006

Come & See us @ IEEE IRPS 2006  -- www.irps.org

Exhibits Open: March 28 &,29, 9 00 a.m.- 5:00 p.m..
March 30: 9:00 a.m. - 12:00 p.m.
San Jose McEnery Convention Center / Hilton S.J. · San Jose, California

FA INSTRUMENTS is at BOOTH # 300

Click Here to Download a FREE Exhibits-only pass

 

February 2006

                  click image to download

 NEW- Case Study: Analysis of Ohmic Leakage                

 

 

October 2005

                    

 

September 2005 - Advancing IC Diagnostics Newsletter

click image to download

 

July 2005 - SEMICON WEST - San Francisco July 12 to 14

Come and see our equipment and product specialists on booth 5143 in the North Hall.  You can find out more at www.semi.org

We look forward to meeting you!

 

July 2005 - IPFA - Singapore

Thank you to all the people who visited us at IPFA. The Show was a big success!

 

A new technical paper we presented at IPFA on Moire Thermal Imaging.  The paper is available for download from our Technical Library or by clicking here.

 

June 2005 - Applications Lab is open for business - Come & Demo our Products in Silicon Valley!

Our demonstration laboratory is fully equipped with the full range of FA Instruments' microscopy solutions as well as a full range of sample preparation systems and analytical tools. 

This allows us to offer an unique fully integrated approach to solve your problems. Schedule a visit to see how we can help you improve your failure analysis capabilities. 

 

May 2005 - New Invited Article in Major Industry Journal

     

FAI announces that Company President, Jim Colvin, is featured in a major industry article as invited Guest Columnist.

The article, entitled "Frequently Asked Questions and the Future of Failure Analysis"; can be found in EDFA Vol 7, No.2. Please click here for a copy of the article.

 

 

May 2005 - IRPS 2005 - San Jose

FAI thanks you for visiting us at IRPS . It was great to meet so many customers and industry colleagues.


 

 

 

 


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