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Crystal Vision Emission Microscope
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Crystal Vision InGaAs Camera System
ULTRASPEC-III Coherent Multi-line Laser Illuminator
Thermal Controller and imaging accessories
Recent Articles
“Advanced Physical Sample Preparation for Failure Analysis”, EDFAS Education Short Format Tutorial, Feb. 2024.
“Backside Preparation and Optics” –Jim Colvin, Christopher Colvin, 7th Edition of ASM’s 2019 “Microelectronics Failure Analysis Desk Reference” pp. 153-179.
“Frontside Sample Preparation” – Jim Colvin, 7th Edition of ASM’s 2019 “Microelectronics Failure Analysis Desk Reference” pp. 144-152
“The Passion of Inventing”, Guest Editor EDFA 2017 Volume 19 Number 2.
"‘In Situ’ Mechanical Sample Preparation of Selected Sites and Components on Large Modules and Boards” - ISTFA 2016
Technical Papers and Tutorials
A selection of technical papers from international symposia (Click to Download)
"FemtoFarad/TeraOhm Endpoint Detection for Microsurgery of Integrated Circuit Devices" - ISTFA 2012 -- Winner of Best Paper in Conference!
"Stress Reduction during Silicon Thinning Using Thermal Relaxation and 3D Curvature Correction Techniques" - ISTFA 2012
"Gradient Thermal Analysis by Induced Stimulus" - ISTFA 2009
"Comparative Failure Analysis of Photovoltaic Devices" -- ISTFA 2009
"FA Tutorial Session - IRPS 2007"
"Frequently Asked Questions and the Future of Failure Analysis"; Jim Colvin, Guest Columnist, EDFA Vol 7, No.2
"Case Study: Analysis of Ohmic Leakage"
"Moiré Stabilized Thermal imaging" - IPFA 2005
"Functional Failure analysis by Induced Stimulus" Awarded: Best Paper in Session, -- ISTFA 2002 "
"The Identification of Compromised Oxide Interfaces Using Noise Signature Techniques From A Constant Current Source" -- ISTFA 1994.
"Color Voltage Contrast: A New Method of Implementing Fault Contrast With Color Imaging Software", Received Outstanding Paper Award -- ISTFA 1995."
"ESD Failure Analysis Methodology", an invited review paper for Microelectronics Reliability; November 1998."
"BGA and Advanced Package Wire to Wire Bonding for Backside Emission Microscopy" -- ISTFA 1999."
"Identification and Analysis of Parasitic Depletion Mode Leakage in a Memory Select Transistor" -- ISTFA 2000."
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